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Journal of the Korean Ceramic Society
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The Effect of the Heat Treatment of the ZrO
2
Buffer Layer and SBT Thin Film on Interfacial Conditions and Ferroelectric Properties of the SrBi
2
Ta
2
O
9
/ZrO
2
/Si Structure
Young-Hun Oh, Chul-Ho Park, Young-Guk Son
J. Korean Ceram. Soc.
2005;42(9):624
DOI:
https://doi.org/10.4191/kcers.2005.42.9.624
Microstructure and Electrical Properties of the Pt/Pb
1.1
Zr
0.53
Ti
0.47
O
3
/PbO/Si (MFIS) Using the PbO Buffer Layer
Chul-Ho Park, Kyoung-Hwan Song, Young-Guk Son
J. Korean Ceram. Soc.
2005;42(2):104
DOI:
https://doi.org/10.4191/kcers.2005.42.2.104
Microstructure and Ferroelectric Properties of PZT Thin Films Deposited on various Interlayers by R.F. Magnetron Sputtering
Chul-Ho Park, Duck-Young Choi, Young-Guk Son
J. Korean Ceram. Soc.
2002;39(8):742
DOI:
https://doi.org/10.4191/kcers.2002.39.8.742
Cited By 2
1
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Materials Science, Ceramics - Q1
Journal Impact Factor 2.7
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