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Journal of the Korean Ceramic Society
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Electronics Ceramics and Energy Ceramics
Structural and Optical Properties of HfO
2
Films on Sapphire Annealed in O
2
Ambient
Jong-Chan Park, Yung-Sup Yoon, Seong-Jun Kang
J. Korean Ceram. Soc.
2016;53(5):563-567. Published online September 30, 2016
DOI:
https://doi.org/10.4191/kcers.2016.53.5.563
Cited By 8
A Study of the Memory Characteristics of Al
2
O
3
/Y
2
O
3
/SiO
2
Multi-Stacked Films with Different Tunnel Oxide Thicknesses
Hye Young Jung, Yoo Youl Choi, Hyung Keun Kim, Doo Jin Choi
J. Korean Ceram. Soc.
2012;49(6):631
DOI:
https://doi.org/10.4191/kcers.2012.49.6.631
Electrical Characteristics of Al
2
O
3
/TaAlO
4
/SiO
2
Multi-layer Films by Different Tunnel Oxide Thicknesses and Annealing Treatment
Jung-Tae Park, Hyo-June Kim, Doo-Jin Choi
J. Korean Ceram. Soc.
2010;47(5):461
DOI:
https://doi.org/10.4191/kcers.2010.47.5.461
A Study on the Electrical Properties of Al
2
O
3
/La
2
O
3
/Al
2
O
3
Multi-Stacked Films Using Tunnel Oxide Annealed at Various Temperatures
Hyo-June Kim, Seung-Yong Cha, Doo-Jin Choi
J. Korean Ceram. Soc.
2009;46(4):436
DOI:
https://doi.org/10.4191/kcers.2009.46.4.436
1
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Materials Science, Ceramics - Q1
Journal Impact Factor 2.5
> Browse Articles > Search
