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The Effect of the Heat Treatment of the ZrO2 Buffer Layer and SBT Thin Film on Interfacial Conditions and Ferroelectric Properties of the SrBi2Ta2O9/ZrO2/Si Structure
Young-Hun Oh, Chul-Ho Park, Young-Guk Son
J. Korean Ceram. Soc. 2005;42(9):624
DOI: https://doi.org/10.4191/kcers.2005.42.9.624
      
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