Systematic determination of the optimized Zr content of Ba(ZrxTi1-x) O3 with high dielectric constant at room temperature for high-voltage system application |
Jandi Kim1,2, Ji Hye Seo1, Sang Heun Lee1,2, Myunghee Cho1,4, Hun Kwak1, Ran Sae Cheon1,2, Seungchan Cho3, Sung Beom Cho5,6, Minhee Kim7, Yoon-Seok Lee8, Yangdo Kim2, Moonhee Choi1 | |