Evaluation of Electrical Characteristics on Semiconducting Ceramics Using Complex Impedance Resonance Method

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J. Korean Ceram. Soc. > Volume 31(8); 1994 > Article

Journal of the Korean Ceramic Society 1994;31(8): 869.

반도성 세라믹스에서 복소임퍼던스 공진법을 이용한 전기적 특성의 평가

윤상옥, 정형진¹, 윤기현²

강릉대학교 재료공학과
¹한국과학기술원 세라믹스연구부
²연세대학교 세라믹공학과

Evaluation of Electrical Characteristics on Semiconducting Ceramics Using Complex Impedance Resonance Method

ABSTRACT

Electrical properties of each interfacial layers on semiconducting ceramics have been analized and evaluated by complex impedance resonance method as functions of ambient temperatures and applied voltages. From the analytical results, it can be observed that the interfacial layers in a semiconducting ceramics vary individually with the ambient temperature and then this influence the total properties. Also, it has been confirmed that the applied voltage on semiconducting ceramics affect mainly the electrode interface, and thus the resistance and capacitance decrease due to the variation of potential barrier layers.