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Self-patterning Technique of Photosensitive La0.5Sr0.5CoO3 Electrode on Ferroelectric Sr0.9Bi2.1Ta2O9 Thin Films
Jong-Chun Lim, Tae-Young Lim, Keun-Ho Auh, Won-Kyu Park, Byong-Ho Kim
J. Korean Ceram. Soc.. 2004;41(1):13    DOI: https://doi.org/10.4191/kcers.2004.41.1.013

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Ferroelectric Characteristics of SrxBi2.4Ta2O9 Thin Films and Electrical Properties of the Pt/SrxBi2.4Ta2O9/TiO2/Si Structure
Materials Science Forum. 2004;449-452:477-480   Crossref logo
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Annealing Treatment of Ferroelectric Pb (Zr0.52Ti0.48)O3 Thin Films with La0.5Sr0.5CoO3 Buffer Layer
Advanced Materials Research. 2013;739:42-46   Crossref logo
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Preparation of Coherent La0.85Sr0.15MnO3 Thin Films on La0.6Sr0.4Co0.2Fe0.8O3 Substrates
Advanced Materials Research. 2013;800:247-255   Crossref logo
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Comparison of Thermal Stability of Epitaxially Grown (La0.5Sr0.5)CoO3 and (La0.6Sr0.4)MnO3 Thin Films Deposited on Si Substrate
Key Engineering Materials. 2010;445:160-163   Crossref logo
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Variation of Electrical Properties of Sr0.8Bi2+XTa2O9+δ Ferroelectric Thin Films with Bismuth Content
Key Engineering Materials. 2003;247:381-384   Crossref logo
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Electrical Properties of Na0.5Bi2.5Ta2O9-Sr1-xBi2+yTa2O9 Solid Solution Ceramics
Key Engineering Materials. 2004;264-268:1241-1244   Crossref logo
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CVD of SrBi2Ta2O9(SBT) Thin Film from Bi(CH3)3 - Sr[Ta(O·C2H5)6]2 - O2 System
Key Engineering Materials. 1999;169-170:145-148   Crossref logo
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The Structural Characterization of Bi2Sr2CaCu2Ox Superconducting Thin Films on (001) Sr TiO3 Substrates
Materials Science Forum. 1993;129:119-128   Crossref logo
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Analyzed by Kelvin Force Microscopy of PbZr0.3Ti0.7O3 Thin Films Grown on La0.5Sr0.5CoO3 or LaMnO3 Bottom Electrodes
Key Engineering Materials. 2006;306-308:1295-1300   Crossref logo
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Ferroelectric Properties of Sol-Gel Derived Ca1-xSrxBi4Ti4O15 Thin Films
Key Engineering Materials. 2008;368-372:100-102   Crossref logo
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