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Refractive Index Dispersion of Aluminate Glasses on the Addition of $SiO_2$

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J. Korean Ceram. Soc.. 1997;34(7):693

Optimization of the<tex>$hbox SiO_2$</tex>Content in CoPtCr-<tex>$hbox SiO_2$</tex>Perpendicular Recording Media for High-Density Recording

Y. Inaba, T. Shimatsu, T. Oikawa, H. Sato, H. Aoi, H. Muraoka, Y. Nakamura

IEEE Transactions on Magnetics. 2004;40(4):2486-2488

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Refractive index measurement of the TeX glasses

H.L. Ma, X.H. Zhang, J. Lucas, R. Iizuka, T. Yamagishi, T. Yamashita

Journal of Non-Crystalline Solids. 1993;161:198-201

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<tex>$hboxTeO_2$</tex>-Based Glasses Containing<tex>$hboxNb_2hboxO_5$</tex>,<tex>$hboxTiO_2$</tex>, and<tex>$hboxWO_3$</tex>for Discrete Raman Fiber Amplification

G. Dai, F. Tassone, A. LiBassi, V. Russo, C.E. Bottani, F. D'Amore

IEEE Photonics Technology Letters. 2004;16(4):1011-1013

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Fiber Loop Ring-Down Refractive Index Sensor Based on High-<inline-formula> <tex-math notation="TeX">$Q$ </tex-math></inline-formula> Photonic Crystal Cavity

Ya-Nan Zhang, Yong Zhao, Di Wu, Qi Wang

IEEE Sensors Journal. 2014;14(6):1878-1885

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Improvement of Voltage Linearity in High-<tex>$kappa$</tex>MIM Capacitors Using<tex>$hbox HfO_2hbox --hbox SiO_2$</tex>Stacked Dielectric

S.J. Kim, B.J. Cho, M.-F. Li, S.-J. Ding, C. Zhu, M.B. Yu, B. Narayanan, A. Chin, D.-L. Kwong

IEEE Electron Device Letters. 2004;25(8):538-540

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An Atomic Force Microscope Study of Surface Roughness of Thin Silicon Films Deposited on<tex>$hbox SiO_2$</tex>

J. Nasrullah, G.L. Tyler, Y. Nishi

IEEE Transactions On Nanotechnology. 2005;4(3):303-311

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Effect of<tex>$rm CVD-hbox SiO_2$</tex>Film on Reliability of GaAs MESFET With Ti/Pt/Au Gate Metal

Y. Saito, T. Hashinaga, S. Nakajima

IEEE Transactions on Reliability. 2005;54(1):79-82

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Martensitic Transformation in Ni<formula formulatype="inline"> <tex Notation="TeX">$_{50}$</tex> </formula>Mn<formula formulatype="inline"> <tex Notation="TeX">$_{50-{\rm x}}$</tex> </formula>Sn<formula formulatype="inline"> <tex Notation="TeX">$_{\rm x}$</tex> </formula><formula formulatype="inline"> <tex Notation="TeX">$({\rm x} = 11, 12.5)$</tex> </formula> and Ni<formula formulatype="inline"> <tex Notation="TeX">$_{49}$</tex> </formula>Mn<formula formulatype="inline"> <tex Notation="TeX">$_{51 - {\rm x}}$</tex> </formula>Sn<formula formulatype="inline"> <tex Notation="TeX">$_{\rm x}$</tex> </formula> <formula formulatype="inline"> <tex Notation="TeX">$({\rm x} =13)$</tex> </formula> Heusler Alloys

M. Nazmunnahar, L. Gonzalez, J. J. del Val, J. Gonzalez, J. J. Sunol, B. Hernando

IEEE Transactions on Magnetics. 2012;48(11):3749-3752

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<formula formulatype="inline"><tex Notation="TeX">$m$</tex></formula>-Consecutive-<formula formulatype="inline"><tex Notation="TeX">$k$</tex></formula>, <formula formulatype="inline"><tex Notation="TeX">$l$</tex></formula>-Out-of-<formula formulatype="inline"><tex Notation="TeX">$n$</tex></formula> Systems

Lirong Cui, Cong Lin, Shijia Du

IEEE Transactions on Reliability. 2015;64(1):386-393

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Effects of <formula formulatype="inline"> <tex Notation="TeX">${\hbox {Na}}^ + $</tex></formula>, <formula formulatype="inline"><tex Notation="TeX">${\hbox {Mg}}^{2+} $</tex> </formula>, <formula formulatype="inline"><tex Notation="TeX">${\hbox {Ca}}^{2+} $</tex></formula>, <formula formulatype="inline"><tex Notation="TeX">${\hbox {Sr}}^{2 +} $</tex></formula> and <formula formulatype="inline"><tex Notation="TeX">${\hbox {Ba}}^{2 +} $</tex> </formula> Doping on the Scintillation Properties of <formula formulatype="inline"><tex Notation="TeX">${\hbox {CeBr}}_3$</tex> </formula>

Roy H. P. Awater, Karl. W. Kramer, Pieter Dorenbos

IEEE Transactions on Nuclear Science. 2015;62(5):2343-2348

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