PublisherDOIYearVolumeIssuePageTitleAuthor(s)Link
Journal of Display Technology10.1109/jdt.2015.24158332015115466-470Effects of Flux Additives on Characteristics of Y$_{2.95}$ Al$_{5}$ O$_{12}$ :0.05Ce$^{3+}$ Phosphor: Thermal Stability and Application to WLEDsChung-Hao Chiang, Te-Hsing Liu, Han-Yu Lin, Hung-Yi Kuo, Sheng-Yuan Chuhttp://xplorestaging.ieee.org/ielx7/9425/7092980/07065206.pdf?arnumber=7065206
IEEE Transactions on Appiled Superconductivity10.1109/tasc.2005.85054020051533864-3867Effect of BaCeO$_3$and BaSnO$_3$Additives on Microstructural Development and Critical Current Density of Melt Textured YBa$_2$Cu$_3$O$_7-x$O. Jongprateep, F. Dogan, M. Strasik, K.E. McCraryhttp://xplorestaging.ieee.org/ielx5/77/32267/01504859.pdf?arnumber=1504859
IEEE Transactions on Reliability10.1109/tr.2014.23595832015642784-798Joint Reliability Importance in a Consecutive- $k$ -out-of-$n$ :F System and an $m$-Consecutive- $k$-out-of-$n$:F System for Markov-Dependent ComponentsXiaoyan Zhu, Mahmoud Boushaba, Mohamed Reghiouahttp://xplorestaging.ieee.org/ielx7/24/7115294/06913575.pdf?arnumber=6913575
IEEE Transactions on Nuclear Science10.1109/tns.2015.246373620156252343-2348Effects of ${\hbox {Na}}^ + $, ${\hbox {Mg}}^{2+} $ , ${\hbox {Ca}}^{2+} $, ${\hbox {Sr}}^{2 +} $ and ${\hbox {Ba}}^{2 +} $ Doping on the Scintillation Properties of ${\hbox {CeBr}}_3$ Roy H. P. Awater, Karl. W. Kramer, Pieter Dorenboshttp://xplorestaging.ieee.org/ielx7/23/7295655/07274371.pdf?arnumber=7274371
IEEE Transactions on Applied Superconductivity10.1109/tasc.2014.236140520152531-4Quench-Induced Dynamic Breakdown Characteristics of $\hbox{LN}_{2}$ and $\hbox{LN}_{2}/\hbox{PPLP}$ Composite Electrical Insulation System for Superconducting Power ApparatusN. Hayakawa, T. Matsuoka, S. Nishimachi, H. Kojimahttp://xplorestaging.ieee.org/ielx7/77/7008631/06915858.pdf?arnumber=6915858
IEEE Journal of Quantum Electronics10.1109/jqe.2014.23142842014506429-433New Optically Pumped Far-Infrared Laser Emissions From $^{13}{\rm CD}_{3}{\rm OH}$ , $^{13}{\rm CD}_{3}{\rm OD}$ , ${\rm CD}_{3}{\rm CN}$ , and $^{13}{\rm CD}_{3}{\rm I}$ Patrick Penoyar, Eric Johnson, Mark McKnight, Michael Jacksonhttp://xplorestaging.ieee.org/ielx7/3/6799262/06785960.pdf?arnumber=6785960
IEEE Transactions on Reliability10.1109/tr.2005.8530372005543412-420Circular Sequential$k$-Out-of-$n$Congestion SystemL. Baihttp://xplorestaging.ieee.org/ielx5/24/32272/01505046.pdf?arnumber=1505046
IEEE Journal of Photovoltaics10.1109/jphotov.2014.2310740201443841-850A Simple Model Describing the Symmetric $I\hbox{--}V$ Characteristics of $\hbox{p}$ Polycrystalline Si/ $\hbox{n}$ Monocrystalline Si, and $\hbox{n}$ Polycrystalline Si/$\hbox{p}$ Monocrystalline Si JunctionsRobby Peibst, Udo Romer, Karl Rudiger Hofmann, Bianca Lim, Tobias F. Wietler, Jan Krugener, Nils-Peter Harder, Rolf Brendelhttp://xplorestaging.ieee.org/ielx7/5503869/6800010/06800058.pdf?arnumber=6800058
IEEE Transactions on Reliability10.1109/tr.2015.24840792016652802-815Reliability and Joint Reliability Importance in a Consecutive- $k$ -Within- $m$ -out-of- $n$ :F System With Markov-Dependent ComponentsXiaoyan Zhu, Mahmoud Boushaba, Mohamed Reghiouahttp://xplorestaging.ieee.org/ielx7/24/7480880/07293231.pdf?arnumber=7293231
IEEE Transactions on Reliability10.1109/tr.2015.24055942015642766-771Computing the Signature of a Generalized $k$ -Out-of-$n$ SystemSerkan Eryilmaz, Altan Tuncelhttp://xplorestaging.ieee.org/ielx7/24/7115294/07055375.pdf?arnumber=7055375