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Effect of $SO_3$ on Calciumsilicate Formation(III)
J. Korean Ceram. Soc.. 1984;21(3):221

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Effect of BaCeO$_3$and BaSnO$_3$Additives on Microstructural Development and Critical Current Density of Melt Textured YBa$_2$Cu$_3$O$_7-x$
IEEE Transactions on Appiled Superconductivity. 2005;15(3):3864-3867   Crossref logo

Effect of Mg Doping on the Superconducting Properties of Cu<tex>$_1-x$</tex>Tl<tex>$_x$</tex>Ba<tex>$_2$</tex>Ca<tex>$_3-y$</tex>Mg<tex>$_y$</tex>Cu<tex>$_4$</tex>O<tex>$_12 - delta$</tex>
IEEE Transactions on Applied Superconductivity. 2006;16(1):2-8   Crossref logo

Martensitic Transformation in Ni $_{50}$ Mn $_{50-{\rm x}}$ Sn $_{\rm x}$ $({\rm x} = 11, 12.5)$ and Ni $_{49}$ Mn $_{51 - {\rm x}}$ Sn $_{\rm x}$ $({\rm x} =13)$ Heusler Alloys
IEEE Transactions on Magnetics. 2012;48(11):3749-3752   Crossref logo

Effect of Thermal Cycling on the Adhesion Strength of<tex>$hboxSn$</tex>–<tex>$hbox9Zn$</tex>–<tex>$hboxxAg$</tex>–<tex>$hboxCu$</tex>Interface
IEEE Transactions on Advanced Packaging. 2004;27(1):158-164   Crossref logo

Ferrimagnetic Sr$_{1.5}$Ba $_{0.5}$Zn$_2$Fe $_{12}$ O$_{22}$ (Zn-Y) Single Crystal With Planar Anisotropy
IEEE Magnetics Letters. 2011;2:5000104-5000104   Crossref logo

Irrecoverable and Recoverable Resistivity Resulting From the First Order Magnetic-Structural Phase Transition in Gd $_5$(Si $_x$Ge$_{1-x}$)$_4$
IEEE Magnetics Letters. 2010;1:6000104-6000104   Crossref logo

Large<tex>$rm T_rm c$</tex>,<tex>$rm B_rm c2$</tex>and<tex>$rm I_rm c$</tex>Enhancement Effect Due to the Prebending Treatment for Bronze Route<tex>$rm Nb_3rm Sn$</tex>Wires
IEEE Transactions on Appiled Superconductivity. 2005;15(2):3564-3567   Crossref logo

Magnetization Dynamics in Vortex-Imprinted Ni$_{80}$ Fe$_{20}$/Ir$_{20}$Mn$_{80}$ Square Elements
IEEE Magnetics Letters. 2012;3:3500204-3500204   Crossref logo

High-Performance (Al $_{x}$Ga $_{1 - x}$) $_{0.5}$In $_{0.5}$P-Based Flip-Chip Light-Emitting Diode With a Geometric Sapphire Shaping Structure
IEEE Photonics Technology Letters. 2008;20(23):1950-1952   Crossref logo

Lower and Upper Reliability Bounds for Consecutive-$k $-Out-of-$ n $:${\rm F}$ Systems
IEEE Transactions on Reliability. 2015;64(3):1128-1135   Crossref logo

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