Optical Properties and Structural Analysis of SiO2 Thick Films Deposited by Plasma Enhanced Chemical Vapor Deposition
Sung-Min Cho, Yong-Tak Kim, Yong-Gon Seo, Hyung-Do Yoon, Young-Min Im, Dae-Ho Yoon
J. Korean Ceram. Soc. 2002;39(5):479     DOI: https://doi.org/10.4191/kcers.2002.39.5.479
Citations to this article as recorded by Crossref logo
Electrochemical Characteristics of Carbon Coated SnO2-SiO2Anode Materials
Gu-Hyun Jeong, Byung-Ki Na
Clean Technology.2013; 19(1): 44.     CrossRef