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Oxidation of CVD β-SiC in Impurity-Controlled Helium Environment at 950℃
Dae-Jong Kim, Weon-Ju Kim, Ji-Eun Jang, Soon-Gil Yoon, Dong-Jin Kim, Ji-Yeon Park
J. Korean Ceram. Soc. 2011;48(5):426
DOI: https://doi.org/10.4191/kcers.2011.48.5.426
         Cited By 4
Electrical Properties of Eco-Friendly RuO2-Based Thick-Film Resistors Containing CaO-ZnO-B2O3-Al2O3-SiO2 System Glass for AlN Substrate
Min-Sik Kim, Hyeong-Jun Kim, Hyung-Tae Kim, Dong-Jin Kim, Young-Do Kim, Sung-Soo Ryu
J. Korean Ceram. Soc. 2010;47(5):467
DOI: https://doi.org/10.4191/kcers.2010.47.5.467
      
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