|
Home
|
E-Submission
|
Sitemap
|
Editorial Office
|
Aims and Scope
About the Journal
Editorial Board
Editorial Office
Submission Guidelines
Research and Publication Ethics
Checklist
E-Submission
Copyright Transfer Agreement
All issues
Articles in Press
Current Issue
Most Read Articles
Most Cited Articles
Journal of the Korean Ceramic Society
Search
Author Index
Journal of the Korean Ceramic Society
Search
> Browse Articles > Search
Effects of Healing Agent on Crack Propagation Behavior in Thermal Barrier Coatings
Soo-Hyeok Jeon, Sung-Hoon Jung, Yeon-Gil Jung
J. Korean Ceram. Soc.
2017;54(6):492-498. Published online November 29, 2017
DOI:
https://doi.org/10.4191/kcers.2017.54.6.02
Cited By 5
Degradation of SOFC Cell/Stack Performance in Relation to Materials Deterioration
Harumi Yokokawa, Teruhisa Horita, Katsuhiko Yamaji, Haruo Kishimoto, M.E. Brito
J. Korean Ceram. Soc.
2012;49(1):11
DOI:
https://doi.org/10.4191/kcers.2012.49.1.011
Cited By 26
Capacitance Aging Behavior of Acceptor-Doped BaTiO
3
under DC Electrical Field
Dong-Woo Hahn, Young-Ho Han
J. Korean Ceram. Soc.
2009;46(2):219
DOI:
https://doi.org/10.4191/kcers.2009.46.2.219
Cited By 2
Thermally Stimulated Depolarization Current Test for
Reliability
of X5R MLCC
Ji-Young Park, Jae-Sung Park, Young-Tae Kim, Kang-Heon Hur
J. Korean Ceram. Soc.
2009;46(2):155
DOI:
https://doi.org/10.4191/kcers.2009.46.2.155
Cited By 3
Strength and
Reliability
of Porous Ceramics Measured by Sphere Indentation on Bilayer Structure
Jang-Hoon Ha, Jong-Ho Kim, Do-Kyung Kim
J. Korean Ceram. Soc.
2004;41(7):503
DOI:
https://doi.org/10.4191/kcers.2004.41.7.503
Nonvolatile Semiconductor Memories Using BT-Based Ferroelectric Films
Bee-Lyong Yang, Suk-Kyoung Hong
J. Korean Ceram. Soc.
2004;41(4):273
DOI:
https://doi.org/10.4191/kcers.2004.41.4.273
Effects of Brazing Processing Condition on Mechanical Properties and
Reliability
of Si
3
N/S.S. 316 Joints
Hwi-Souck Chang, Sang-Whan Park, Sung-Churl Choi
J. Korean Ceram. Soc.
2002;39(10):955
DOI:
https://doi.org/10.4191/kcers.2002.39.10.955
Microstructure and Fracture Strength of Si3N4 Joint System
차재철, 강신후, 박상환
J. Korean Ceram. Soc.
1999;36(8):835
Effect of WSi
$_2$
Gate Electrode on Thin Oxide Properties in MOS Device
박진성, 이현우, 김갑식, 문종하, 이은구
J. Korean Ceram. Soc.
1998;35(3):259
Effect of Interlayer Materials on Bending Strength and
Reliability
of Si
$_3$
N
$_4$
/S. S316 Joint
윤호욱, 박상환, 최성민, 임연수, 정윤중
J. Korean Ceram. Soc.
1998;35(3):219
1
|
Materials Science, Ceramics - Q1
Journal Impact Factor 2.7
> Browse Articles > Search
