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Effects of Healing Agent on Crack Propagation Behavior in Thermal Barrier Coatings
Soo-Hyeok Jeon, Sung-Hoon Jung, Yeon-Gil Jung
J. Korean Ceram. Soc. 2017;54(6):492-498.   Published online November 29, 2017
DOI: https://doi.org/10.4191/kcers.2017.54.6.02
                                 Cited By 3
Degradation of SOFC Cell/Stack Performance in Relation to Materials Deterioration
Harumi Yokokawa, Teruhisa Horita, Katsuhiko Yamaji, Haruo Kishimoto, M.E. Brito
J. Korean Ceram. Soc. 2012;49(1):11
DOI: https://doi.org/10.4191/kcers.2012.49.1.011
         Cited By 22
Capacitance Aging Behavior of Acceptor-Doped BaTiO3 under DC Electrical Field
Dong-Woo Hahn, Young-Ho Han
J. Korean Ceram. Soc. 2009;46(2):219
DOI: https://doi.org/10.4191/kcers.2009.46.2.219
         Cited By 1
Thermally Stimulated Depolarization Current Test for Reliability of X5R MLCC
Ji-Young Park, Jae-Sung Park, Young-Tae Kim, Kang-Heon Hur
J. Korean Ceram. Soc. 2009;46(2):155
DOI: https://doi.org/10.4191/kcers.2009.46.2.155
         Cited By 2
Strength and Reliability of Porous Ceramics Measured by Sphere Indentation on Bilayer Structure
Jang-Hoon Ha, Jong-Ho Kim, Do-Kyung Kim
J. Korean Ceram. Soc. 2004;41(7):503
DOI: https://doi.org/10.4191/kcers.2004.41.7.503
Nonvolatile Semiconductor Memories Using BT-Based Ferroelectric Films
Bee-Lyong Yang, Suk-Kyoung Hong
J. Korean Ceram. Soc. 2004;41(4):273
DOI: https://doi.org/10.4191/kcers.2004.41.4.273
Effects of Brazing Processing Condition on Mechanical Properties and Reliability of Si3N/S.S. 316 Joints
Hwi-Souck Chang, Sang-Whan Park, Sung-Churl Choi
J. Korean Ceram. Soc. 2002;39(10):955
DOI: https://doi.org/10.4191/kcers.2002.39.10.955
Microstructure and Fracture Strength of Si3N4 Joint System
차재철, 강신후, 박상환
J. Korean Ceram. Soc. 1999;36(8):835
Effect of WSi$_2$ Gate Electrode on Thin Oxide Properties in MOS Device
박진성, 이현우, 김갑식, 문종하, 이은구
J. Korean Ceram. Soc. 1998;35(3):259
Effect of Interlayer Materials on Bending Strength and Reliability of Si$_3$N$_4$/S. S316 Joint
윤호욱, 박상환, 최성민, 임연수, 정윤중
J. Korean Ceram. Soc. 1998;35(3):219
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