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Resistive random access memory characteristics of NiO, NiO0.95, and NiO0.95/NiO/NiO0.95 thin films
Eunmi Lee, Jong Yeog Son
J. Korean Ceram. Soc. 2024;61(4):593-598.   Published online March 22, 2024
DOI: https://doi.org/10.1007/s43207-024-00379-9
         Cited By 11
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